Fig. 2From: Phase patterning of metallic glasses through superfast quenching of ion irradiation-induced thermal spikesa–d Cross sectional TEM micrographs, localized diffraction patterns, and HRTEM images of an MG irradiated by 3.5 MeV Cu ions to a fluence of 1 × 1016 ions/cm2 at 440 °C, 450 °C, 460 °C, and 480 °C, respectively. Superimposed are SRIM damage profiles. All the diffraction patterns and HRTEM micrographs were collected within the damage zone (depth < RP)Back to article page