Figure 4
Absorptance of gold nanoparticle embedded thin films. (a) Finite element method (FEM) calculated absorption rates, determined for the sample with the highest absorbing SnSx coated Au array at its peak wavelength. A plane wave with incident electric field strength E0 propagates along the normal (x-) direction, with its electric field vector along z. The rectangular unit cell used for the hexagonal lattice is shown below the plot (dashed lines). (b) Analogous for ZnO coated sample. (c,d) Sample reflectance (R), array absorptance (A), and absorptance in the Al reflector (AAl, including intermix layer), as calculated by FEM and obtained from the spectroscopic ellipsometry (SE) model. (e) FEM calculated absorptance in the Au dots of the SnSx coated sample, in the SnSx coating, and in the SiO2 spacer, respectively. (f) Analogous for the ZnO coated sample. (From Ref. [70])
Absorptance of gold nanoparticle embedded thin films. (a) Finite element method (FEM) calculated absorption rates, determined for the sample with the highest absorbing SnSx coated Au array at its peak wavelength. A plane wave with incident electric field strength E0 propagates along the normal (x-) direction, with its electric field vector along z. The rectangular unit cell used for the hexagonal lattice is shown below the plot (dashed lines). (b) Analogous for ZnO coated sample. (c, d) Sample reflectance (R), array absorptance (A), and absorptance in the Al reflector (AAl, including intermix layer), as calculated by FEM and obtained from the spectroscopic ellipsometry (SE) model. (e) FEM calculated absorptance in the Au dots of the SnSx coated sample, in the SnSx coating, and in the SiO2 spacer, respectively. (f) Analogous for the ZnO coated sample (From Ref. [70]).