Fig. 2From: A slanted-nanoaperture metal lens: subdiffraction-limited focusing of light in the intermediate field regionTransmission through a tilted nanoaperture. a Schematic cross-section of a tilted nanoslit formed in a metal film. A 633-nm TM-polarized light is incident from the bottom side. The transmission patterns calculated by FDTD simulation: b the distribution of magnetic field amplitude |Hz|; c a snapshot image of magnetic field Hz. Circular wavefronts emanate from the nanoslit aperture with tilted peak-intensity orientation. d The field intensity distribution scanned along the normal direction at x = − 2.5 µm (dashed). The total field (black) is decomposed into two parts: surface-plasmon field (SP, red) and free-space propagating component (DP, blue). e SEM image of a tilted nanoslit aperture formed in a Cr film (100- to 140-nm thick). Scale bar, 1 µm. f A beam profile measured by scanning an NSOM probeBack to article page