Fig. 2From: Microscopic evidence of strong interactions between chemical vapor deposited 2D MoS2 film and SiO2 growth templateChanges in the interlayer distance at the MoS2/SiO2 interface. a Position at which the interlayer distance values were measured in the AS-MoS2 films. b Plot of the interlayer distance of AS-MoS2. The black solid line represents the average value of the interlayer distance with error. c Position at which the interlayer distance values were measured in the TR-MoS2 films. d Plot of the interlayer distance of TR-MoS2. The black solid line represents the average value of the distance with errorBack to article page