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Nano Convergence
Fig. 5 | Nano Convergence

Fig. 5

From: Grain boundary passivation via balancing feedback of hole barrier modulation in HfO2-x for nanoscale flexible electronics

Fig. 5

Grain-boundary-related CPD and current mapping for the conducting HfO2-x thin film during bending. a Schematics of flexible thin films on convex (left) and concave (right) molds and the corresponding tensile and compressive strain, respectively. A photograph of the bent HfO2-x thin film is shown in the middle. Topographies (left) and current mapping images (middle) obtained at b -10°, c 0°, and d 60°, and topographies (left) and CPD mapping images (middle) obtained at e -10°, f 0°, and g 60°. Line profiles (right) are shown for the red lines

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