Fig. 1
Epitaxial stabilization of BLSO films on (0001)Al2O3 with BaZrO3/MgO template bilayer. For convenience, the simpler form of \({\mathrm{BLSO}}_{\mathrm{substrate}}^{\mathrm{template \; layers}}\) is used. a The (110), (200), (220), and (222) diffraction peaks in the X-ray diffraction (XRD) θ–2θ scan of \({\mathrm{BLSO}}_{(0001){\mathrm{Al}}_{2}{\mathrm{O}}_{3}}\) indicate the formation of mixed-crystalline phases. The asterisks indicate the (003) and (006) diffraction peaks of Al2O3. b The XRD θ–2θ scan of \({\mathrm{BLSO}}_{(0001){\mathrm{Al}}_{2}{\mathrm{O}}_{3}}^{{\mathrm{BaZrO}}_{3}/\mathrm{MgO}}\) shows the (111) and (222) diffraction peaks of BaZrO3/MgO and BLSO, indicating the formation of (111)-oriented BLSO epitaxial films on (0001)Al2O3 with (111)BaZrO3/MgO template bilayer. c The XRD ϕ scans of (110)BLSO, (110)BaZrO3, and (220)MgO show six diffraction peaks separated by 30° from (012)Al2O3, corresponding to three-fold symmetric in-plane matching, as schematically shown in d. e The full-width at half-maximum in the XRD ω-scans decrease from 1.07° in \({\mathrm{BLSO}}_{(0001){\mathrm{Al}}_{2}{\mathrm{O}}_{3}}^{\mathrm{MgO}}\) to 0.39° in \({\mathrm{BLSO}}_{(0001){\mathrm{Al}}_{2}{\mathrm{O}}_{3}}^{{\mathrm{BaZrO}}_{3}/\mathrm{MgO}}\), indicating an improved crystallinity of the BLSO epitaxial films with the use of the BaZrO3 template layer