Fig. 1From: Vertical nanoscale strain-induced electronic localization in epitaxial La2/3Sr1/3MnO3 films with ZrO2 nanopillar inclusionsa Plane-view high resolution high angle annular dark field (HAADF) image of LSMO thin film with x = 0.3 ZrO2 precipitatedon LaAlO3 (001) substrate. b Low mag STEM image of cross-sectioning view of x = 0.3 thin film; c a relatively high magnification image of a representative single pillar in LSMO; d the corresponding false-colored image for the representative single pillar based on the FFT diffractogramBack to article page