Fig. 3

a−d Damage cascade schematic, cross sectional TEM micrograph, HRTEM/diffraction pattern within R_p, and HRTEM/diffraction pattern beyond R_p of an annealed (600 °C for 2 h) + irradiated (3.5 MeV Cu at room temperature, 1 × 10¹⁴/cm²) MG. e–h Damage cascade schematic, cross sectional TEM micrograph, HRTEM/diffraction pattern within R_p, and HRTEM/diffraction pattern beyond R_p of an annealed (800 °C for 4 h) + irradiated (3.5 MeV Cu at room temperature, 1 × 10¹⁴/cm²) MG. i EDS mapping, collected within R_p, for the specimen shown in f. j EDS mapping, collected beyond R_p, for the specimen shown in f. SRIM dpa curves are superimposed in b and f