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Table 2 A summary table of various filament-free switching memristors along with key parameters

From: Filament-free memristors for computing

Type

Junction structure

Device size (μm2)

Operating voltage (V)

Endurance (cycles)

Retention (s)

ON/OFF ratio

Uniformity

(d2d/c2c)

Refs.

Ion migration

Pt/anodized TiOx/Ti

5 × 5–50 × 50

− 2.5 to 3

5 × 106 pulses

4 × 10–2

< 10

3.87%/1.39%

[57]

Pt/a-GaOx/ITO

 ~ 1–30,000

− 2 to 2

–

–

< 10

–/Good

[56]

TiOx/TiO2−x/YSZ/TiO2/Pt

–

− 1.5 to 1.5

3 × 108 pulses

107

< 3

–/Good

[58]

Au/MAPbI3/ITO

500 × 500

− 1 to 1

–

< 10–2

< 10

–/Good

[59]

Pt/TiO2/TiO2−x/Pt

0.05 × 0.05

− 2 to 2

–

NA

~ 103

–/Good

[60]

Au/Nb:SrTiO3

π × 150 × 150

− 6 to 3

104

104

> 104

Good/Good

[61]

Pt/TaOy/nanoporous TaOx/Ta

π × 100 × 100

− 4 to 4

5 × 103

1.2 × 104

< 102

< 59%/Good

[63]

Intercalation

Au/LixCoO2/SiOx/TiO2/p++-Si

300 × 300

− 5 to 5

> 2 × 103

–

< 10

–/Good

[69]

Au/LixCoO2/doped-Si

10 × 10–500 × 500

− 7 to 7

> 2 × 102

> 3 × 102

> 103

–

[71]

Cr/LiCoO2/LiPON/a-Si/TiN

300 × 300

− 10 to 10

3 × 103 pulses

> 103

–

–

[72]

Planar device Li1−xNbO2 with Ti and Al contacts

–

− 10 to 10

–

> 2 × 103

> 20

–/Good

[73]

Electron trapping /detrapping

Au/TiO2 nanorod array/FTO

π × 750 × 750

− 4 to 2

–

< 2

> 102

–

[83]

Au/WO3/FTO

50 × 50

− 3 to 3

103 pulses

104

< 10

–/Good

[84]

Ti/HfO2/Pt

2 × 2–20 × 20

− 3 to 2

103

105

< 102

Good/Good

[85]

Planar device Ba0.7Sr0.3TiO3 with Pt contacts

–

− 90 to 90

–

2.5 × 102

< 10

–

[86]

Au/OD-IGZO/OR-IGZO/Pt

π × 50 × 50

− 2 to 2

2 × 103 pulses

104

< 3

–/Good

[87]

Ag/Bi2S3 nano-network/FTO

π × 400 × 400

− 1 to 1

–

–

< 10

–

[88]

Pt/NbOx/TiOy/NbOx/TiN

π × 0.015 × 0.015

− 10 to 10

5 × 103

3 × 103

> 102

–/Good

[89]

Pt/Ta2O5/Nb2O5−x/Al2O3-y/Ti

5 × 5

− 10 to 10

105

2 × 105

> 8 × 103

Good/Good

[90]

Ferroelectric polarization

W/Zr:HfO2/SiO2/doped Si

π × 20 × 20–π × 70 × 70

− 3 to 3

103

104

> 2 × 102

Good/Good

[102]

Co/BaTiO3/La0.67Sr0.33MnO3/NdGaO3

π × 0.175 × 0.175

− 5.6 to 4.2

–

–

3 × 102

–

[103]

TiN/HfSiO2/SiO2/bottom electrode

0.15 × 0.15–0.5 × 0.5

− 4.4 to 4.4

–

–

> 3

Good/Good

[104]

Cr/CuInP2S6/Graphene

–

− 5.5 to 4.5

5 × 103

> 2 × 104

106

–/Good

[105]

Ag/BaTiO3/Nb:SrTiO3

π × 20 × 20

− 3.4 to 3

108

104

 > 102

–/Good

[106]

Ag/PbZr0.52Ti0.48O3/ Nb:SrTiO3

π × 50 × 50

− 3.8 to 4

109

104

 > 102

–/2.06%

[107]

Mo/(Hf,Zr)O2/TiON/TiN

20 × 20–100 × 100

− 2 to 2

108

3 × 104

 < 10

3.2%/3.6%

[108]

Ti/BaTiO3/SrTiO3/SrRuO3

π × 0.25 × 0.25

− 8 to 8

2 × 103

–

104

–

[109]

Phase transition

Planar device Mos2 with Ti contacts

–

− 50 to 50

5 × 103 pulses

–

< 3

–

[118]

Planar device LixMos2 with Au contacts

–

− 6 to 6

4 × 104 pulses

> 7 × 103

< 10

–

[119]

Ti/Al2O3/MoTe2/Au

0.36 × 0.39

− 3 to 3.5

–

103

> 105

–/Good

[120]

Ag/MoS2/Ag

–

− 0.2 to 0.2

103

–

103

–/Good

[122]

Au/SrCoOx/Nb:SrTiO3

π × 100 × 100

− 5.5 to 1

7 × 102

104

> 103

Good/Good

[123]

Au/SrCoOx/SrRuO3

4 × 4–100 × 100

− 3 to 3

108

3 × 103

> 10

Good/Good

[124]

Au/SrFeOx/SrRuO3

π × 50 × 50

− 4 to 4

6 × 106

< 2

> 10

35%/22%

[125]

PT/α-MoO3/SrCoO2.5/Nb:SrTiO3

π × 25 × 25

− 3 to 3

5 × 104

> 103

< 10

Good/Good

[126]

Filling-controlled Mott transition

Planar device NdNiO3 with Pt contacts

–

− 8 to 8

3.6 × 103 pulses

> 103

< 10

Good/Good

[138]

Planar device NdNiO3 or SmNiO3 with Au and Pd contacts

–

− 8.1 to 8.1

106

4 × 104

10

–/Good

[139]

Pt/GdNiO3−x/Nb:SrTiO3

70 × 70

− 5 to 5

104

> 3 × 104

> 103

Good/Good

[141]

W probe/La2Ti2O7−x/TiN

–

− 2.5 to 2.5

103

–

< 10

–/Good

[142]

  1. Note that c2c and d2d in the column of uniformity indicate cycle-to-cycle and device-to-device variation, where the coefficient of deviation (standard deviation/mean × 100%) is used when available. Otherwise, the uniformity is represented as good and poor based on how identical the switching behaviors are at switching cycle (c2c) and each device (d2d)